Lu Yan
at Zhejiang Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 6 March 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Image segmentation, Detection and tracking algorithms, Image processing algorithms and systems, Hough transforms, Imaging systems, Microscopes, Image processing, Scattering, Defect detection, Light scattering

Proceedings Article | 6 March 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Defect detection, Scattering, Imaging systems, Light scattering, Calibration, Machine vision, Standards development, Laser scattering, Image processing, Statistical analysis

Proceedings Article | 18 September 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Charge-coupled devices, CCD cameras, Defect detection, Imaging systems, Optical components, Image processing, Binary data, Cameras, CCD image sensors, Microscopes

Proceedings Article | 6 August 2014
Proc. SPIE. 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Calibration, Image processing, Photomasks, Optical components, Microscopes, Imaging systems, Optics manufacturing, Scanning electron microscopy, Image segmentation, Scattering

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