Lu Yan
at Zhejiang Univ
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Image processing algorithms and systems, Microscopes, Defect detection, Detection and tracking algorithms, Imaging systems, Scattering, Image segmentation, Image processing, Light scattering, Hough transforms

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Statistical analysis, Defect detection, Imaging systems, Scattering, Calibration, Image processing, Light scattering, Laser scattering, Machine vision, Standards development

PROCEEDINGS ARTICLE | September 18, 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Optical components, Microscopes, Defect detection, Imaging systems, Cameras, Image processing, CCD cameras, Charge-coupled devices, CCD image sensors, Binary data

PROCEEDINGS ARTICLE | August 6, 2014
Proc. SPIE. 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Optical components, Microscopes, Imaging systems, Scattering, Calibration, Image segmentation, Image processing, Scanning electron microscopy, Photomasks, Optics manufacturing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top