Luan Zeng
at Harbin Institute of Technology
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | August 5, 2015
Proc. SPIE. 9622, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
KEYWORDS: Target detection, 3D acquisition, Detection and tracking algorithms, Cameras, Calibration, Feature extraction, 3D metrology, Target recognition, Automatic target recognition, 3D image processing

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Optical spheres, Stars, Cameras, Calibration, Satellites, Image processing, Error analysis, 3D modeling, Computer vision technology, Machine vision

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Image compression, Detection and tracking algorithms, Cameras, Calibration, Machine vision, Image enhancement, Reconstruction algorithms, Zirconium, 3D vision, 3D image processing

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: 3D image reconstruction, Detection and tracking algorithms, Image processing, Pattern recognition, Wavelets, Computer vision technology, Machine vision, Image filtering, Reconstruction algorithms, 3D vision

PROCEEDINGS ARTICLE | January 31, 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Image fusion, Metrology, Lithium, Principal component analysis, Detection and tracking algorithms, Image processing, Calcium, Image analysis, Geometrical optics, Optical pattern recognition

PROCEEDINGS ARTICLE | December 31, 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Image fusion, Cameras, Image processing, Remote sensing, Distortion, Image registration, Instrumentation engineering, Electronics engineering, Statistical modeling, Americium

Showing 5 of 7 publications
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