Luca Callegaro
Researcher at IEN Galileo Ferraris
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Statistical analysis, Resistance, Interference (communication), Amplifiers, Capacitance, Thermometry, Measurement devices, Resistors, Temperature metrology, Wattmeters

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