Dr. Lucia Alianelli
at Diamond Light Source Ltd
SPIE Involvement:
Conference Program Committee | Author
Publications (9)

Proceedings Article | 15 September 2016
Proc. SPIE. 9963, Advances in X-Ray/EUV Optics and Components XI
KEYWORDS: Lithography, X-ray optics, Diamond, Lenses, Etching, X-rays, Silicon, Lens design, Computer generated holography, Synchrotrons

Proceedings Article | 5 September 2014
Proc. SPIE. 9209, Advances in Computational Methods for X-Ray Optics III
KEYWORDS: Optical components, Mirrors, Electron beams, Light sources, X-rays, Wavefronts, Wave propagation, Optical simulations, Synchrotron radiation, Light wave propagation

Proceedings Article | 20 September 2007
Proc. SPIE. 6705, Advances in X-Ray/EUV Optics and Components II
KEYWORDS: Electron beam lithography, Mirrors, Light sources, X-ray optics, Diamond, Cameras, X-rays, Silicon, Optical fabrication, Computer generated holography

Proceedings Article | 29 August 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Mirrors, Light sources, X-ray optics, Diamond, Metrology, Lenses, Error analysis, X-rays, Synchrotrons, Optics manufacturing

Proceedings Article | 21 October 2004
Proc. SPIE. 5536, Advances in Computational Methods for X-Ray and Neutron Optics
KEYWORDS: Diffraction, Scattering, Particles, Crystals, X-rays, Copper, Reflectivity, Computer simulations, Monte Carlo methods, Laser crystals

Showing 5 of 9 publications
Conference Committee Involvement (15)
Advances in X-Ray/EUV Optics and Components XV
23 August 2020 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XIV
14 August 2019 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XIII
20 August 2018 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics IV
9 August 2017 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Showing 5 of 15 Conference Committees
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