Dr. Luigi Castiglione
at cosine measurement systems
SPIE Involvement:
Publications (8)

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 1267903 (2023) https://doi.org/10.1117/12.2678106
KEYWORDS: Mirrors, Silicon, X-ray optics, Semiconducting wafers, Wafer-level optics, X-rays, Synchrotron radiation, Ion beam finishing, Mirror surfaces, Laser cutting

Proceedings Article | 12 July 2023 Open Access Paper
Proceedings Volume 12777, 127770R (2023) https://doi.org/10.1117/12.2689003
KEYWORDS: Mirrors, Silicon, X-rays, Semiconducting wafers, Optics manufacturing, X-ray optics, Robots, Astronomical imaging, Wafer-level optics, Space mirrors

Proceedings Article | 31 August 2022 Presentation + Paper
Proceedings Volume 12181, 121810U (2022) https://doi.org/10.1117/12.2630775
KEYWORDS: Mirrors, Semiconducting wafers, Silicon, X-rays, Robots, X-ray optics, Wafer-level optics, Synchrotron radiation, Optical fabrication, Optical coatings

Proceedings Article | 17 September 2021 Presentation + Paper
Proceedings Volume 11822, 1182208 (2021) https://doi.org/10.1117/12.2594171
KEYWORDS: Mirrors, Tolerancing, Confocal microscopy, Mirror structures, Ear, X-ray optics, Epoxies, Silicon, Point spread functions, Optical alignment

Proceedings Article | 3 September 2021 Presentation + Paper
Proceedings Volume 11822, 1182207 (2021) https://doi.org/10.1117/12.2594234
KEYWORDS: Coating, Mirrors, Silicon, Semiconducting wafers, Photoresist materials, Optics manufacturing, Reflectivity, Inspection, Photography, Packaging

Showing 5 of 8 publications
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