Mr. Luis Alves
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | July 26, 2011
Proc. SPIE. 8001, International Conference on Applications of Optics and Photonics
KEYWORDS: Refractive index, Polymethylmethacrylate, Silica, Visualization, Reflection, Graphene, Dielectrics, Silicon, Semiconducting wafers, Visibility

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