Luiz Vicente Gomes Tarelho was born in 1971 and received the M.Sc. and D.Sc. degrees from the University of São Paulo, in 1995 and 2001, respectively. In 1998, he became an Assistant Researcher at Nuclear and Energy Research Institute in São Paulo. There, he was promoted to Associate Researcher in 2006 and he was developing several femtosecond laser applications. In September 2008, he was appointed as Researcher at the Brazilian National Metrology Institute– INMETRO in Rio de Janeiro. His research interests nowadays cover the field of optical metrology standardization , frequency combs and nanometrology applications.
Improving axial resolution in spectral domain low-coherence interferometry through fast Fourier transform harmonic artifacts
Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference
Laser induced breakdown spectroscopy (LIBS) applied to stratigrafic elemental analysis and optical coherence tomography (OCT) to damage determination of cultural heritage Brazilian coins
Enhancement of europium luminescence in tetracycline-europium complex in the presence of urea hydrogen peroxide