Dr. Luka Eciolaza
at Mondragon Univ.
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 4 February 2020
JEI, Vol. 29, Issue 04, 041007, (February 2020) https://doi.org/10.1117/12.10.1117/1.JEI.29.4.041007
KEYWORDS: Image segmentation, Inspection, Cameras, Modulation, Data modeling, Computer programming, LCDs, Image processing, Convolutional neural networks, Defect detection

Proceedings Article | 16 July 2019 Paper
Proceedings Volume 11172, 1117209 (2019) https://doi.org/10.1117/12.2521740
KEYWORDS: Deflectometry, Specular reflections, Optical inspection, Machine vision, Defect inspection, Image segmentation, Inspection, Cameras, Surface finishing, Convolutional neural networks, Defect detection, Computer programming, Visualization

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