Dr. Lukas Helfen
at Karlsruher Institut für Technologie
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 5 September 2014 Paper
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Scattering, Lenses, X-rays, Wavefronts, Wave propagation, Optical simulations, X-ray imaging, Beryllium, Beam propagation method, Plasma

Proceedings Article | 16 September 2008 Paper
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Light sources, Cameras, Sensors, Crystals, X-rays, Scintillators, Image resolution, Synchrotrons, Spatial resolution, Monochromators

Proceedings Article | 11 September 2006 Paper
Proc. SPIE. 6318, Developments in X-Ray Tomography V
KEYWORDS: X-ray computed tomography, Sensors, X-rays, Nondestructive evaluation, Synchrotrons, Modulation transfer functions, Spatial resolution, Synchrotron radiation, X-ray imaging, 3D image processing

Proceedings Article | 21 July 2004 Paper
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Mirrors, Microscopy, X-rays, X-ray diffraction, Silicon, Nondestructive evaluation, Scanning electron microscopy, X-ray imaging, Acoustics, Semiconducting wafers

Proceedings Article | 23 December 2003 Paper
Proc. SPIE. 5195, Crystals, Multilayers, and Other Synchrotron Optics
KEYWORDS: Diffraction, Scattering, Sensors, Crystals, X-rays, Gallium arsenide, Laser crystals, Spatial resolution, Monochromators, Semiconducting wafers

Showing 5 of 7 publications
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