Dr. Lutz Kirste
at Fraunhofer-IAF
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | May 23, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Long wavelength infrared, Infrared sensors, Mid-IR, Photodetectors, Sensors, Photodiodes, Diodes, Semiconducting wafers, Heterojunctions, Superlattices

PROCEEDINGS ARTICLE | January 31, 2014
Proc. SPIE. 8993, Quantum Sensing and Nanophotonic Devices XI
KEYWORDS: Infrared detectors, Long wavelength infrared, Infrared sensors, Short wave infrared radiation, Photodetectors, Indium gallium arsenide, Avalanche photodetectors, Sensors, Infrared radiation, Infrared photography

PROCEEDINGS ARTICLE | October 25, 2013
Proc. SPIE. 8896, Electro-Optical and Infrared Systems: Technology and Applications X
KEYWORDS: Staring arrays, Infrared detectors, Short wave infrared radiation, Photodetectors, Indium gallium arsenide, Avalanche photodetectors, Cameras, Sensors, Detector development, Diodes

PROCEEDINGS ARTICLE | June 11, 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Mid-IR, Data modeling, Etching, Photodiodes, Gallium antimonide, Diodes, Palladium, Wet etching, Semiconducting wafers, Superlattices

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Staring arrays, Thermography, Mid-IR, Sensors, Etching, Gallium antimonide, Detector arrays, Semiconducting wafers, Superlattices, Stereolithography

PROCEEDINGS ARTICLE | February 9, 2011
Proc. SPIE. 7954, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XV
KEYWORDS: Light emitting diodes, External quantum efficiency, Crystals, Reflectivity, Electroluminescence, Atomic force microscopy, Transmission electron microscopy, Gallium nitride, 3D metrology, Aluminum

Showing 5 of 9 publications
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