Dr. M. Jamal Deen
at McMaster Univ
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (24)

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10526, Physics and Simulation of Optoelectronic Devices XXVI
KEYWORDS: Photodetectors, Avalanche photodetectors, Quantum efficiency, Absorption

SPIE Journal Paper | June 1, 2011
JBO Vol. 16 Issue 06
KEYWORDS: Endoscopes, Mirrors, Modulation transfer functions, Prototyping, Lens design, Combined lens-mirror systems, Objectives, Monte Carlo methods, Endoscopy, Imaging systems

PROCEEDINGS ARTICLE | June 22, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Carbon, Chemical species, Silicon, Diffusion, Interference (communication), Boron, Transistors, Silicon carbide, Heterojunctions, Temperature metrology

SPIE Conference Volume | May 23, 2005

PROCEEDINGS ARTICLE | December 20, 2004
Proc. SPIE. 5577, Photonics North 2004: Optical Components and Devices
KEYWORDS: Photodetectors, Waveguides, Electrons, Quantum efficiency, Resistance, Capacitance, Resistors, Waveguide modes, Performance modeling, Absorption

PROCEEDINGS ARTICLE | December 20, 2004
Proc. SPIE. 5577, Photonics North 2004: Optical Components and Devices
KEYWORDS: Signal to noise ratio, Photodetectors, Mirrors, Avalanche photodetectors, Electrons, Quantum efficiency, Resistance, Capacitance, Inductance, Absorption

Showing 5 of 24 publications
Conference Committee Involvement (6)
Noise and Fluctuations in Circuits, Devices, and Materials
21 May 2007 | Florence, Italy
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Noise in Devices and Circuits II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise and Information in Nanoelectronics, Sensors, and Standards
2 June 2003 | Santa Fe, New Mexico, United States
Noise in Devices and Circuits
2 June 2003 | Santa Fe, New Mexico, United States
Showing 5 of 6 published special sections
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