Masayuki Hayakawa
at OMRON Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 August 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Light sources, Statistical analysis, Calibration, Spectroscopy, Silicon, Polarizers, Wave plates, Polarimetry, Head, Prototyping

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