Maciej Stankiewicz
at Wroclaw Univ of Technology
SPIE Involvement:
Author
Area of Expertise:
Vision Systems
Websites:
Publications (2)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Imaging systems, Cameras, 3D modeling, 3D metrology, Computer aided design, Chemical elements, Systems modeling, Solid modeling, 3D image processing, Laser systems engineering

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Reflection, Cameras, Image segmentation, Light scattering, Inspection, Reflectivity, Distortion, 3D modeling, Algorithm development, 3D image processing

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