Prof. Mahendra Prasad Kothiyal
Retired at
SPIE Involvement:
Fellow status | Conference Program Committee | Author
Publications (28)

PROCEEDINGS ARTICLE | July 17, 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Fringe analysis, Microsystems, Interferometers, Reflectivity, Interferometry, CCD cameras, Profiling, Optical interferometry, Charge-coupled devices, Phase shifts

PROCEEDINGS ARTICLE | March 4, 2015
Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014
KEYWORDS: Fringe analysis, Microsystems, Interferometers, CCD cameras, Profiling, 3D metrology, Optical interferometry, Charge-coupled devices, Phase shifts, RGB color model

PROCEEDINGS ARTICLE | March 4, 2015
Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014
KEYWORDS: Ferroelectric materials, Speckle, Interferometry, Nondestructive evaluation, CCD cameras, Data acquisition, Speckle pattern, Speckle interferometry, Charge-coupled devices, Phase shifts

SPIE Journal Paper | November 3, 2014
OE Vol. 53 Issue 11
KEYWORDS: Nondestructive evaluation, Microscopic TV holography, CCD cameras, Charge-coupled devices, Cameras, Holography, Data acquisition, Speckle, Phase measurement, Collimation

PROCEEDINGS ARTICLE | September 10, 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Mirrors, Fringe analysis, Digital signal processing, Microsystems, Digital photography, Speckle, Interferometers, Digital filtering, Photography, Phase shifts

SPIE Journal Paper | July 1, 2009
OE Vol. 48 Issue 07
KEYWORDS: Interferometry, Phase shifts, Phase interferometry, Silicon, Optical engineering, Charge-coupled devices, Phase measurement, Optical interferometry, Ferroelectric materials, Phase shifting

Showing 5 of 28 publications
Conference Committee Involvement (3)
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
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