Maihan H. Nguyen
Photolithography Engineer at Samsung Austin Semiconductor
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 November 2005 Paper
Proc. SPIE. 5992, 25th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Reticles, Air contamination, Control systems, Wafer inspection, Inspection, Semiconducting wafers, Manufacturing, Databases, Semiconductors, Process control

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top