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Makoto Ogasawara
at Hitachi Ltd
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Publications (1)
Proceedings Article | 27 August 1997 Paper
Statistical analysis of dynamic-random-access-memory data-retention characteristics
Atsushi Hiraiwa, Makoto Ogasawara, Nobuyoshi Natsuaki, Yutaka Itoh, Hidetoshi Iwai
Proceedings Volume 3212, (1997) https://doi.org/10.1117/12.284578
KEYWORDS: Statistical analysis, Electrodes, Information operations, Capacitors, Statistical modeling, Chlorine, Silicon, Dielectrics, Data modeling, Integrated circuits
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