Makoto Umezawa
at HORIBA, Ltd.
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

PROCEEDINGS ARTICLE | August 6, 2014
Proc. SPIE. 9232, International Conference on Optical Particle Characterization (OPC 2014)
KEYWORDS: Statistical analysis, Particles, Light scattering, Numerical simulations, Computer simulations, Image analysis, Inverse problems, Algorithm development, Scatter measurement, Iterative methods

Conference Committee Involvement (1)
International Conference on Optical Particle Characterization (OPC 2014)
10 March 2014 | Tokyo, Japan
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