Manabendra Maji
Software Engineer at Mentor Graphics (Sales and Services) Private Ltd
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | November 8, 2012
Proc. SPIE. 8522, Photomask Technology 2012
KEYWORDS: Defect detection, Opacity, Inspection, Image registration, Photomasks, Charge-coupled devices, SRAF, Critical dimension metrology, Semiconducting wafers, Defect inspection

PROCEEDINGS ARTICLE | October 14, 2011
Proc. SPIE. 8166, Photomask Technology 2011
KEYWORDS: Defect detection, Detection and tracking algorithms, Imaging systems, Cameras, Image processing, Inspection, Image registration, CCD cameras, Photomasks, Charge-coupled devices

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