Dr. Manfred L Bitter
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SPIE Involvement:
Conference Program Committee | Author
Publications (7)

PROCEEDINGS ARTICLE | October 16, 2017
Proc. SPIE. 10450, International Conference on Extreme Ultraviolet Lithography 2017
KEYWORDS: Reflectors, Patents, Crystals, X-rays, Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography, X-ray imaging, Spherical lenses, Semiconducting wafers

PROCEEDINGS ARTICLE | September 28, 2017
Proc. SPIE. 10390, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion VI
KEYWORDS: Image fusion, Opacity, Spectroscopy, X-rays, Ions, Streak cameras, X-ray imaging, National Ignition Facility, Temperature metrology, Plasma

PROCEEDINGS ARTICLE | September 17, 2014
Proc. SPIE. 9209, Advances in Computational Methods for X-Ray Optics III
KEYWORDS: Sensors, Spectroscopy, Crystals, X-rays, Spectral resolution, Spatial resolution, X-ray imaging, X-ray detectors, Temperature metrology, Plasma

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
KEYWORDS: Sensors, Crystals, X-rays, Spectrometers, Plasmas, Imaging spectroscopy, Spatial resolution, X-ray imaging, Spherical lenses, Crystallography

PROCEEDINGS ARTICLE | September 23, 2011
Proc. SPIE. 8141, Advances in Computational Methods for X-Ray Optics II
KEYWORDS: Sensors, Spectroscopy, Crystals, X-rays, Plasmas, Laser welding, Diagnostics, X-ray imaging, Temperature metrology, Fusion energy

PROCEEDINGS ARTICLE | November 14, 2001
Proc. SPIE. 4501, X-Ray Mirrors, Crystals, and Multilayers
KEYWORDS: Mica, Reflection, Calibration, Spectroscopy, Error analysis, Crystals, X-rays, Reflectivity, Kinematics, Spectral resolution

Showing 5 of 7 publications
Conference Committee Involvement (1)
Advances in Computational Methods for X-Ray Optics II
21 August 2011 | San Diego, California, United States
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