Mankyu Kang
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 March 2014 Paper
Mankyu Kang, Seonae Kim, JinHyuck Jung, Heebom Kim, Inkyun Shin, Chanuk Jeon, Haiwon Lee
Proceedings Volume 9051, 90511U (2014) https://doi.org/10.1117/12.2045641
KEYWORDS: Lithography, Zirconium, Atomic force microscopy, Metals, Coating, Image processing, Electron beam lithography, Oxides, Atomic force microscope, Line edge roughness

Proceedings Article | 30 October 2007 Paper
Man-Kyu Kang, Jung-Hun Lee, Seong-Yoon Kim, Byung-Gook Kim, Sang-Gyun Woo, Han-Ku Cho
Proceedings Volume 6730, 67300H (2007) https://doi.org/10.1117/12.746565
KEYWORDS: Critical dimension metrology, Photoresist developing, Photoresist materials, Error analysis, Chemical analysis, Photoresist processing, Process control, Photomasks, Control systems, Electron beams

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