Miss Mantong Zhao
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Hyperspectral imaging, Infrared imaging, Visible radiation, Principal component analysis, Statistical analysis, Imaging systems, Calibration, Inspection, Reflectivity, Imaging spectroscopy

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