Dr. Manuel Campos-García
Researcher at Univ Nacional Autónoma de México
SPIE Involvement:
Conference Program Committee | Author
Publications (33)

PROCEEDINGS ARTICLE | June 15, 2018
Proc. SPIE. 10692, Optical Fabrication, Testing, and Metrology VI
KEYWORDS: Optical components, Mirrors, Optical design, Reflection, Cameras, CCD cameras, LCDs, Ray tracing, Aspheric lenses, Charge-coupled devices

PROCEEDINGS ARTICLE | June 15, 2018
Proc. SPIE. 10692, Optical Fabrication, Testing, and Metrology VI
KEYWORDS: Eye, Cornea, Reflection, Calibration, Optical testing, Optical metrology, Aspheric lenses, CCD image sensors, Testing and analysis

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Metrology, Solar concentrators, Error analysis, Numerical simulations, Optical metrology, Aspheric lenses, Reconstruction algorithms, Algorithm development, Quality testing methods

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Mirrors, Reflection, Numerical integration, Computer simulations, Optical testing, CCD cameras, Optical metrology, Ray tracing, 3D metrology, Aspheric lenses, CCD image sensors, Imaging arrays

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Eye, Metrology, Cornea, Image processing, Crystals, Optical metrology, Deflectometry, Ray tracing, Aspheric lenses, Charge-coupled devices, Iterative methods, Binary data

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Metrology, Optical spheres, Image processing, Computer simulations, Optical testing, Optical metrology, Deflectometry, Spherical lenses

Showing 5 of 33 publications
Conference Committee Involvement (1)
Interferometry XIX
21 August 2018 | San Diego, California, United States
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