Dr. Manuel Espínola
at Indo Internacional SA
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Metrology, Radon, Spatial frequencies, Sensors, Error analysis, Fourier transforms, Interference (communication), Finite difference methods, Deflectometry, Photonic integrated circuits

PROCEEDINGS ARTICLE | June 3, 2007
Proc. SPIE. 9665, Tenth International Topical Meeting on Education and Training in Optics and Photonics
KEYWORDS: Diffraction, Optical filters, Holograms, Holography, Spatial frequencies, Image processing, Fourier transforms, Physics, Image filtering, Filtering (signal processing)

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