Dr. Manuel Guizar-Sicairos
Beamline Scientist at
SPIE Involvement:
Scholarship Committee | Senior status | Author
Publications (14)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10656, Image Sensing Technologies: Materials, Devices, Systems, and Applications V
KEYWORDS: Diffraction, X-rays, X-ray microscopy, Tomography, Integrated circuits, X-ray imaging

PROCEEDINGS ARTICLE | October 3, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Optical components, Diffraction, X-ray optics, Optical lithography, Lenses, X-rays, Near field, Collimation, Zone plates, Near field optics

PROCEEDINGS ARTICLE | September 18, 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Coherence imaging, Refractive index, Light sources, X-rays, X-ray microscopy, Tomography, Reconstruction algorithms, Algorithm development, X-ray imaging, X-ray characterization

PROCEEDINGS ARTICLE | April 17, 2014
Proc. SPIE. 9048, Extreme Ultraviolet (EUV) Lithography V
KEYWORDS: Diffraction, Light sources, Sensors, Inspection, Reflectivity, Photomasks, Extreme ultraviolet, Charge-coupled devices, Extreme ultraviolet lithography, CCD image sensors

PROCEEDINGS ARTICLE | November 3, 2011
Proc. SPIE. 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World
KEYWORDS: Coherence imaging, X-ray computed tomography, X-rays, X-ray diffraction, X-ray microscopy, Tomography, Image quality, Algorithm development, X-ray imaging, Absorption

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Electron beam lithography, Coherence imaging, X-ray optics, X-rays, X-ray diffraction, Reconstruction algorithms, Spatial resolution, Zone plates, Hard x-rays, Iridium

Showing 5 of 14 publications
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