Maor Tiferet
at Bar-Ilan Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11267, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXV
KEYWORDS: Refractive index, Waveguides, Crystals, Silicon, Semiconductor lasers, Scanning electron microscopy, Refraction, Silicon photonics, Semiconducting wafers, Absorption

Proceedings Article | 21 February 2020 Paper
Proc. SPIE. 11254, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVII
KEYWORDS: Infrared imaging, Diffraction, Semiconductor lasers, Infrared lasers, Laser beam diagnostics

Proceedings Article | 5 March 2019 Paper
Proc. SPIE. 10891, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVI
KEYWORDS: Diffraction, Point spread functions, Refractive index, Super resolution, Silicon, Beam shaping, Absorption

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