Mr. Marc B. Airola
Associate Professional Engineer at Johns Hopkins Univ Applied Physics Lab
SPIE Involvement:
Author
Publications (11)

PROCEEDINGS ARTICLE | May 25, 2018
Proc. SPIE. 10631, Ocean Sensing and Monitoring X
KEYWORDS: Long wavelength infrared, Oscillators, Contamination, Water, Reflectivity, Refraction, Infrared radiation, Temperature metrology, Liquids, Absorption

PROCEEDINGS ARTICLE | October 31, 2014
Proc. SPIE. 9254, Emerging Technologies in Security and Defence II; and Quantum-Physics-based Information Security III
KEYWORDS: Radar, Long wavelength infrared, Infrared cameras, Infrared sensors, Mid-IR, Visible radiation, Sensors, Calibration, Ka band, Ranging

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9205, Reflection, Scattering, and Diffraction from Surfaces IV
KEYWORDS: Long wavelength infrared, Scattering, Ultraviolet radiation, Ceramics, Reflectivity, Carbon dioxide lasers, Bidirectional reflectance transmission function, Solids, Statistical modeling, Temperature metrology

PROCEEDINGS ARTICLE | May 4, 2010
Proc. SPIE. 7685, Atmospheric Propagation VII
KEYWORDS: Optical amplifiers, Data modeling, Adaptive optics, Ocean optics, Telecommunications, Turbulence, Free space optics, Free space optical communications, Temperature metrology, Channel projecting optics

PROCEEDINGS ARTICLE | May 8, 2009
Proc. SPIE. 7304, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing X
KEYWORDS: Refractive index, Visible radiation, Scattering, Water, Particles, Humidity, Solids, Barium, Atmospheric particles, Absorption

PROCEEDINGS ARTICLE | May 11, 2007
Proc. SPIE. 6554, Chemical and Biological Sensing VIII
KEYWORDS: Thin films, Refractive index, Data modeling, Backscatter, Aerosols, Ultraviolet radiation, Refraction, Transmittance, Atmospheric modeling, Absorption

Showing 5 of 11 publications
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