Semi-insulating and conducting SiC crystalline transparent substrates were studied after being processed by
femtosecond laser radiation (780nm at 160fs). Z-scan and damage threshold experiments were performed on both SiC
bulk materials to determine each samples' nonlinear and threshold parameters. "Damage" in this text refers to an index
of refraction modification as observed visually under an optical microscope. In addition, a study was performed to
understand the damage threshold as a function of numerical aperture. Presented here for the first time, to the best of our
knowledge, is the damage threshold, nonlinear index of refraction, and nonlinear absorption measured values.