Marc Finet
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 February 2008
Proc. SPIE. 6875, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII
KEYWORDS: Silicon carbide, Laser damage threshold, Femtosecond phenomena, Absorption, Refraction, Optical microscopes, Atomic force microscopy, Laser processing, Silicon, Image processing

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