Dr. Marc Gronle
at Institut für Technische Optik
SPIE Involvement:
Publications (16)

Proceedings Article | 18 December 2019 Paper
Proceedings Volume 11338, 113383F (2019) https://doi.org/10.1117/12.2548075
KEYWORDS: Speckle, Sensors, Speckle pattern, Spatial light modulators, Digital holography, Stochastic processes, Image sensors, Holograms, Diffraction

Proceedings Article | 21 June 2019 Presentation + Paper
Proceedings Volume 11056, 1105613 (2019) https://doi.org/10.1117/12.2525568
KEYWORDS: Imaging systems, Distortion, Diffractive optical elements, Image restoration, Chromatic aberrations, Sensors, Deconvolution, Objectives, Diffraction

Proceedings Article | 14 September 2018 Paper
Proceedings Volume 10744, 107440J (2018) https://doi.org/10.1117/12.2320486
KEYWORDS: Speckle, Speckle pattern, Sensors, Denoising, Monochromatic aberrations, Computer generated holography, Spatial light modulators, Holography, Light sources, Holograms

Proceedings Article | 26 June 2017 Paper
Tobias Boettcher, Marc Gronle, Wolfgang Osten
Proceedings Volume 10329, 103290K (2017) https://doi.org/10.1117/12.2270270
KEYWORDS: Optical spheres, Objectives, Microscopes, Confocal microscopy, Refractive index, Interferometry, Tomography, Inspection, Optical testing, Interferometers, Refraction

Proceedings Article | 26 June 2017 Paper
Proceedings Volume 10329, 1032914 (2017) https://doi.org/10.1117/12.2269499
KEYWORDS: Semiconducting wafers, Safety, Packaging, Wafer-level optics, Interferometers, Microelectromechanical systems, Optical inspection, Sensors, Interferometry, Silica, Short wave infrared radiation, Optical metrology, Inspection, Optical testing, Confocal microscopy

Showing 5 of 16 publications
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