Marc Gronle
at Institut für Technische Optik
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | September 14, 2018
Proc. SPIE. 10744, Laser Beam Shaping XVIII
KEYWORDS: Monochromatic aberrations, Light sources, Holograms, Holography, Speckle, Sensors, Denoising, Computer generated holography, Spatial light modulators, Speckle pattern

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Microelectromechanical systems, Packaging, Wafer-level optics, Confocal microscopy, Short wave infrared radiation, Safety, Silica, Interferometers, Sensors, Inspection, Interferometry, Optical testing, Optical inspection, Optical metrology, Semiconducting wafers

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Confocal microscopy, Microscopes, Refractive index, Optical spheres, Interferometers, Inspection, Interferometry, Optical testing, Tomography, Refraction, Objectives

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Confocal microscopy, Light sources, Finite-difference time-domain method, Reflection, Scattering, Calibration, Metals, Light scattering, Inspection, Reflectivity, Optical inspection, Bidirectional reflectance transmission function, Ray tracing, Machine vision, Process modeling

PROCEEDINGS ARTICLE | September 1, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical imaging, Mirrors, Beam splitters, Light sources, Imaging systems, Cameras, Sensors, Optical coherence tomography, Signal processing, Objectives

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9530, Automated Visual Inspection and Machine Vision
KEYWORDS: Holograms, Quantum wells, Diffractive optical elements, Imaging systems, Cameras, Sensors, Calibration, Error analysis, Electrons, Image sensors

Showing 5 of 14 publications
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