Dr. Marc O. Schillgalies
VP, Development at First Sensor AG
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 11 March 2010
Proc. SPIE. 7602, Gallium Nitride Materials and Devices V
KEYWORDS: Light sources, Quantum wells, Quantum efficiency, Laser applications, Semiconductor lasers, Gallium nitride, Laser damage threshold, Indium gallium nitride, Applied physics, Testing and analysis

Proceedings Article | 12 February 2010
Proc. SPIE. 7616, Novel In-Plane Semiconductor Lasers IX
KEYWORDS: Continuous wave operation, Waveguides, Electroluminescence, Semiconductor lasers, Gallium nitride, Diodes, Laser damage threshold, Indium gallium nitride, Pulsed laser operation, Charged particle optics

Proceedings Article | 8 May 2008
Proc. SPIE. 6997, Semiconductor Lasers and Laser Dynamics III
KEYWORDS: Superposition, Refractive index, Waveguides, Semiconductor lasers, Near field scanning optical microscopy, Thermal effects, Optical simulations, Modes of laser operation, Temperature metrology, Near field optics

Proceedings Article | 8 May 2008
Proc. SPIE. 6997, Semiconductor Lasers and Laser Dynamics III
KEYWORDS: Quantum wells, Waveguides, Electroluminescence, Semiconductor lasers, Gallium nitride, Aluminum, Optical simulations, Laser damage threshold, Indium gallium nitride, Silicon carbide

Proceedings Article | 15 February 2008
Proc. SPIE. 6894, Gallium Nitride Materials and Devices III
KEYWORDS: Quantum wells, Magnesium, Luminescence, Laser applications, Reflectivity, Doping, Semiconductor lasers, Projection systems, Laser damage threshold, Indium gallium nitride

Showing 5 of 6 publications
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