Marc Tricard
Vice President & General Manager at MKS - Newport
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Optics manufacturing , Metrology , Electro-Optical Systems , Finishing
Websites:
Publications (22)

Proceedings Article | 4 June 2013
Proc. SPIE. 8708, Window and Dome Technologies and Materials XIII
KEYWORDS: Polishing, Metrology, Coating, Manufacturing, Zinc, Sapphire, Reconnaissance, Intelligence systems, Thin film coatings, Optics manufacturing

Proceedings Article | 17 September 2008
Proc. SPIE. 7062, Laser Beam Shaping IX
KEYWORDS: Polishing, Manufacturing, Interferometry, Wavefronts, Control systems, Optics manufacturing, National Ignition Facility, Magnetorheological finishing, Surface finishing, Laser systems engineering

Proceedings Article | 21 September 2007
Proc. SPIE. 6671, Optical Manufacturing and Testing VII
KEYWORDS: Mirrors, Polishing, Metrology, Optical testing, Aspheric optics, Aspheric lenses, Astronomical imaging, Optics manufacturing, Magnetorheological finishing, Surface finishing

Proceedings Article | 14 May 2007
Proc. SPIE. 10316, Optifab 2007: Technical Digest
KEYWORDS: Optical design, Spindles, Polishing, Principal component analysis, Magnetism, Collimation, Abrasives, Spherical lenses, Surface finishing, Plano

Proceedings Article | 14 May 2007
Proc. SPIE. 10316, Optifab 2007: Technical Digest
KEYWORDS: Single point diamond turning, Polishing, Metrology, Optical spheres, Manufacturing, Aspheric optics, Aspheric lenses, Optics manufacturing, Magnetorheological finishing, Surface finishing

Showing 5 of 22 publications
Conference Committee Involvement (6)
Window and Dome Technologies and Materials XVI
18 April 2019 | Baltimore, Maryland, United States
Window and Dome Technologies and Materials XV
11 April 2017 | Anaheim, California, United States
Optical Materials and Structures Technologies IV
2 August 2009 | San Diego, California, United States
Optical Materials and Structures Technologies III
26 August 2007 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
Showing 5 of 6 Conference Committees
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