Marcus S. Dersch
at Univ of Illinois
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 March 2021 Presentation + Paper
Proceedings Volume 11592, 115920J (2021) https://doi.org/10.1117/12.2581798
KEYWORDS: Machine learning, Algorithm development, Temperature metrology, Optimization (mathematics), Nondestructive evaluation

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