Dr. Marek Guziewicz
at Institute of Electron Technology
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10229, Photon Counting Applications 2017
KEYWORDS: Photodetectors, Ferromagnetics, Sputter deposition, Annealing, Magnetism, Superconductors, Sapphire, Electroluminescent displays, Thermodynamics, Temperature metrology

PROCEEDINGS ARTICLE | December 22, 2016
Proc. SPIE. 10175, Electron Technology Conference 2016
KEYWORDS: Polishing, Sensors, Resistance, Superconductors, Bridges, Aluminum, Silicon carbide, Single photon detectors, Temperature metrology, Quantum computing

PROCEEDINGS ARTICLE | May 6, 2015
Proc. SPIE. 9504, Photon Counting Applications 2015
KEYWORDS: Photodetectors, Nanostructures, Ferromagnetics, Nickel, Interfaces, Magnetism, Superconductors, Bridges, Temperature metrology, Photonic nanostructures

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Glasses, Particles, Copper, Ceramics, Silver, Resistance, Scanning electron microscopy, Diodes, Silicon carbide, Temperature metrology

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Reflection, Argon, Annealing, Crystals, Superconductors, Transmission electron microscopy, Sapphire, Structural analysis, Niobium, Corundum

PROCEEDINGS ARTICLE | April 17, 2001
Proc. SPIE. 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology
KEYWORDS: Oxides, Polishing, Etching, Dielectrics, Gallium antimonide, Atomic force microscopy, Reactive ion etching, Anisotropic etching, Surface finishing, Plasma

Showing 5 of 6 publications
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