Marek Vlk
at UiT Arctic Univ of Norway
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 March 2019 Presentation
Proc. SPIE. 10914, Optical Components and Materials XVI
KEYWORDS: Wafer-level optics, Mid-IR, Environmental monitoring, Safety, Point-of-care devices, Waveguides, Spectroscopy, Diagnostics, Wave sensors, Molecular spectroscopy

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