Dr. Marek Wieland
at Univ Hamburg
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 18, 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Microscopes, Optical filters, Polymethylmethacrylate, Nickel, Silicon, Aluminum, Zone plates, Zirconium, Free electron lasers, Absorption

PROCEEDINGS ARTICLE | August 29, 2006
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Microscopes, Titanium, X-rays, X-ray microscopy, Nitrogen, Imaging spectroscopy, Laser induced plasma spectroscopy, Extreme ultraviolet, Zone plates, Plasma

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