Maria Oliva
at JENOPTIK Optical Systems GmbH
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 27, 2013
Proc. SPIE. 8840, Optical Modeling and Performance Predictions VI
KEYWORDS: Metamaterials, Optical components, Nanostructures, Optical design, Nanostructuring, Data modeling, Polarizers, Transmittance, Optics manufacturing, Near field optics

PROCEEDINGS ARTICLE | September 13, 2011
Proc. SPIE. 8110, Thin Film Solar Technology III
KEYWORDS: Plasmonics, Scattering, Nanoparticles, Particles, Solar cells, Interfaces, Silicon, Silver, Atomic force microscopy, Absorption

PROCEEDINGS ARTICLE | May 14, 2010
Proc. SPIE. 7716, Micro-Optics 2010
KEYWORDS: Lithography, Electron beam lithography, Diffraction, Optical design, Etching, Chromium, Photomasks, Optical alignment, Standards development, Diffraction gratings

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Optical components, Silica, Etching, Chromium, Atomic force microscopy, Scanning electron microscopy, Photomasks, Associative arrays, Critical dimension metrology, Binary data

PROCEEDINGS ARTICLE | September 9, 2006
Proc. SPIE. 6290, Laser Beam Shaping VII
KEYWORDS: Lithography, Optical lithography, Modulation, Gallium nitride, Gas lasers, Microelectronics, Beam shaping, Bragg cells, Helium cadmium lasers, Laser systems engineering

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