Dr. Mariusz Zbroszczyk
at Institute of Electron Technology
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | October 25, 2005
Proc. SPIE. 6013, Optoelectronic Devices: Physics, Fabrication, and Application II
KEYWORDS: Infrared cameras, Thermography, Infrared imaging, Mid-IR, Cameras, High power lasers, Luminescence, Semiconductor lasers, Temperature metrology, Channel projecting optics

PROCEEDINGS ARTICLE | March 17, 2005
Proc. SPIE. 5711, High-Power Diode Laser Technology and Applications III
KEYWORDS: Thermography, Data modeling, High power lasers, Semiconductor lasers, Micro raman spectroscopy, Finite element methods, Spatial resolution, Heatsinks, Thermal modeling, Temperature metrology

PROCEEDINGS ARTICLE | September 24, 2004
Proc. SPIE. 5582, Advanced Optoelectronics and Lasers
KEYWORDS: Semiconductors, Mirrors, Quantum wells, Waveguides, Photons, Gallium arsenide, Semiconductor lasers, Thermal effects, Thermal analysis, Phonons

PROCEEDINGS ARTICLE | June 18, 2004
Proc. SPIE. 5349, Physics and Simulation of Optoelectronic Devices XII
KEYWORDS: Quantum wells, High power lasers, Gallium arsenide, Indium, Quantum efficiency, Laser development, Semiconductor lasers, Aluminum, Laser damage threshold, Gallium

PROCEEDINGS ARTICLE | October 6, 2003
Proc. SPIE. 5230, Laser Technology VII: Progress in Lasers
KEYWORDS: Mirrors, Quantum wells, Quantum efficiency, Laser applications, Reflectivity, Semiconductor lasers, Laser resonators, Laser damage threshold, Hole burning spectroscopy, Laser optics

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