Dr. Mark A. Crowder
at Sharp Labs of America Inc
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 16, 2003
Proc. SPIE. 5004, Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas
KEYWORDS: Amorphous silicon, Thin films, Crystals, Silicon, Scanning electron microscopy, Solids, Measurement devices, Transistors, Laser crystals, Laser sintering

PROCEEDINGS ARTICLE | May 16, 2003
Proc. SPIE. 5004, Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas
KEYWORDS: Thin films, Oscillators, Crystals, Silicon, Surface roughness, Solids, Microelectronics, Transistors, Integrated circuit design, Laser sintering

PROCEEDINGS ARTICLE | May 16, 2003
Proc. SPIE. 5004, Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas
KEYWORDS: Oxides, Thin films, Refractive index, Capacitors, Dielectrics, Plasma enhanced chemical vapor deposition, Molybdenum, Thin film deposition, Thin film devices, Plasma

PROCEEDINGS ARTICLE | May 16, 2003
Proc. SPIE. 5004, Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas
KEYWORDS: Amorphous silicon, Sputter deposition, Crystals, Silicon, Doping, Silicon films, Boron, Plasma enhanced chemical vapor deposition, Laser crystals, Semiconducting wafers

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