Mark Helfrick
at Univ of Massachusetts Lowell
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 April 2009 Paper
Proceedings Volume 7295, 72950D (2009) https://doi.org/10.1117/12.815511
KEYWORDS: Damage detection, Digital image correlation, 3D image processing, 3D metrology, Aluminum, Finite element methods, Data modeling, Model-based design, Systems modeling, Global system for mobile communications

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