Mark Helfrick
at Univ of Massachusetts Lowell
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | April 8, 2009
Proc. SPIE. 7295, Health Monitoring of Structural and Biological Systems 2009
KEYWORDS: Data modeling, 3D metrology, Finite element methods, Damage detection, Digital image correlation, Aluminum, Systems modeling, Model-based design, Global system for mobile communications, 3D image processing

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