Dr. Mark A. Lindeman
at Jet Propulsion Lab
SPIE Involvement:
Publications (9)

Proceedings Article | 25 September 2012 Paper
L. Gottardi, H. Akamatsu, M. Bruijn, J.R. Gao, R. den Hartog, R. Hijmering, H. Hoevers, P. Khosropanah, J. van der Kuur, T. van der Linden, M. Lindeman, M. Ridder
Proceedings Volume 8453, 845333 (2012) https://doi.org/10.1117/12.925506
KEYWORDS: Bolometers, Magnetism, Fused deposition modeling, X-rays, Multiplexers, Niobium, Temperature metrology, Amplifiers, Resonators, Superconductors

Proceedings Article | 29 September 2004 Paper
Proceedings Volume 5501, (2004) https://doi.org/10.1117/12.552063
KEYWORDS: Bismuth, Copper, X-rays, Diffusion, Resistance, Annealing, Imaging spectroscopy, Scanning electron microscopy, X-ray imaging, Silicon

Proceedings Article | 29 September 2004 Paper
Proceedings Volume 5501, (2004) https://doi.org/10.1117/12.552311
KEYWORDS: Data modeling, Sensors, X-rays, Gold, Instrument modeling, Silicon, Bismuth, Multiplexers, Solids, Resistance

Proceedings Article | 11 March 2003 Paper
Mark Lindeman, Simon Bandler, Regis Brekosky, James Chervenak, Enectali Figueroa-Feliciano, Fred Finkbeiner, Massimiliano Galeazzi, Mary Li, Caroline Stahle
Proceedings Volume 4851, (2003) https://doi.org/10.1117/12.461466
KEYWORDS: Resistance, Error analysis, Superconductors, Data modeling, Molybdenum, Gold, X-rays, Transition metals, Temperature metrology, Tellurium

Proceedings Article | 13 December 2000 Paper
Proceedings Volume 4140, (2000) https://doi.org/10.1117/12.409138
KEYWORDS: Sensors, X-rays, Bismuth, X-ray imaging, Gold, Image resolution, Silicon, Photons, Imaging spectroscopy, Spectrometers

Showing 5 of 9 publications
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