Dr. Mark J. McCollum
Sr. Process Engineering Manager
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 May 1994
Proc. SPIE. 2141, Spectroscopic Characterization Techniques for Semiconductor Technology V
KEYWORDS: Reflectors, Refractive index, Mirrors, X-ray optics, Quantum wells, Remote sensing, X-rays, Reflectivity, Reflectance spectroscopy, Vertical cavity surface emitting lasers

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