Mark W. Perpall
at Clemson Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 15, 2003
Proc. SPIE. 4979, Micromachining and Microfabrication Process Technology VIII
KEYWORDS: Carbon, Optical fibers, Refractive index, Silica, Electrodes, Polymers, Capillaries, Silicon, Scanning electron microscopy, Polymerization

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