Mark Zhang
at Xi'an Jiaotong Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Fringe analysis, Modulation, Error analysis, Interferometry, Phase shift keying, Demodulation, Computer simulations, Reconstruction algorithms, Phase measurement, Phase shifts

Proceedings Article | 21 June 2019
Proc. SPIE. 11062, Digital Optical Technologies 2019
KEYWORDS: Photovoltaics, Fluctuations and noise, Error analysis, Manufacturing, Image analysis, Phase retrieval, Finite difference methods, Phase measurement, Systems engineering

Proceedings Article | 23 August 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Opto mechatronics, Interferometry, Computer simulations, Aspheric lenses, Stitching interferometry

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