Mr. Markus Emerich
at OeBS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 3, 2004
Proc. SPIE. 5310, Optical Security and Counterfeit Deterrence Techniques V
KEYWORDS: Visualization, Spectroscopy, Ultraviolet radiation, Luminescence, Lamps, Xenon, Printing, CCD image sensors, Standards development, Light

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