Dr. Markus Kästner
Leader, Production Measurement/Testing Technology at Leibniz Univ Hannover
SPIE Involvement:
Author
Publications (31)

SPIE Journal Paper | 2 June 2020
OE Vol. 59 Issue 06
KEYWORDS: Cameras, Refractive index, Projection systems, 3D metrology, Optical testing, 3D modeling, Calibration, Optical engineering, Algorithm development, Temperature metrology

SPIE Journal Paper | 26 May 2020
OE Vol. 59 Issue 05
KEYWORDS: Cameras, Calibration, Sensors, Distortion, Mirrors, Stereo vision systems, 3D acquisition, Matrices, Projection systems, Clouds

Proceedings Article | 1 April 2020
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Cameras, Sensors, Calibration, Refraction, 3D modeling, Inspection, Refractive index, Projection systems, Stereoscopic cameras, Matrices

Proceedings Article | 1 April 2020
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Calibration, Projection systems, Cameras, Kinematics, 3D metrology, Imaging systems, Endoscopy, Sensors

Proceedings Article | 1 April 2020
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: 3D metrology, Control systems, Sensors, Optical testing

Showing 5 of 31 publications
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