Markus C. Knauer
at Univ Erlangen-Nuernberg
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 September 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Mirrors, Fringe analysis, Imaging systems, Cameras, Sensors, Calibration, Eyeglasses, Deflectometry, Projection systems, Phase measurement

Proceedings Article | 28 April 2000
Proc. SPIE. 3915, Coherence Domain Optical Methods in Biomedical Science and Clinical Applications IV
KEYWORDS: Radar, Signal to noise ratio, Light sources, Modulation, Scattering, Interferometers, Optical coherence tomography, Spectroscopy, Skin, Light scattering

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