Marten Oldsen
at Infineon Technologies AG
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 February 2008 Paper
M. Oldsen, U. Hofmann, H. J. Quenzer, J. Janes, C. Stolte, K. Gruber, M. Ites, F. Sörensen, B. Wagner
Proceedings Volume 6882, 688208 (2008) https://doi.org/10.1117/12.760941
KEYWORDS: Semiconducting wafers, Mirrors, Wafer bonding, Silicon, Glasses, Scanners, Oxides, Optical resolution, Micromirrors, Gold

Proceedings Article | 21 February 2008 Paper
Ulrich Hofmann, Marten Oldsen, Hans-Joachim Quenzer, Joachim Janes, Martin Heller, Manfred Weiss, Georgios Fakas, Lars Ratzmann, Eleonora Marchetti, Francesco D'Ascoli, Massimiliano Melani, Luca Bacciarelli, Emilio Volpi, Francesco Battini, Luca Mostardini, Francesco Sechi, Marco De Marinis, Bernd Wagner
Proceedings Volume 6887, 688706 (2008) https://doi.org/10.1117/12.763433
KEYWORDS: Mirrors, Semiconducting wafers, Micromirrors, Silicon, Microelectromechanical systems, Laser based displays, Packaging, Scanners, Raster graphics, Sensors

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