Mr. Martin Bischoff Profile

Martin Bischoff

at Fraunhofer-IOF

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 4 October 2011 Paper

Optical and mechanical properties of oxide UV coatings, prepared by PVD techniques

Olaf Stenzel, Mark Schürmann, Steffen Wilbrandt, Norbert Kaiser, Andreas Tünnermann, Mathias Mende, Henrik Ehlers, Detlev Ristau, Stefan Bruns, Michael Vergöhl, Werner Riggers, Martin Bischoff, Mario Held

Proceedings Volume 8168, 81681W (2011) https://doi.org/10.1117/12.896775

KEYWORDS: Coating, Ultraviolet radiation, Oxides, Refractive index, Silicon, Thin films, Glasses, Temperature metrology, Silica, Semiconducting wafers

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Proceedings Article | 22 April 2009 Paper

Long term tests of resonator optics in ArF excimer lasers

Nils Beermann, Holger Blaschke, Henrik Ehlers, Detlev Ristau, Dirk Wulff-Molder, Sigrid Jukresch, Ansgar Matern, Martin Bischoff, Dieter Gäbler, Norbert Kaiser

Proceedings Volume 7131, 713117 (2009) https://doi.org/10.1117/12.816706

KEYWORDS: Resonators, Reflectors, Contamination, Excimer lasers, Laser optics, Optical coatings, Crystals, Interfaces, Laser resonators, Mirrors

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Proceedings Article | 30 December 2008 Paper

Investigation in the degradation of CaF2 outcouplers in excimer lasers operating at 193nm

H. Blaschke, N. Beermann, H. Ehlers, D. Ristau, M. Bischoff, D. Gäbler, N. Kaiser, A. Matern, D. Wulff-Molder

Proceedings Volume 7132, 71321A (2008) https://doi.org/10.1117/12.804428

KEYWORDS: Excimer lasers, Coating, Reflectors, Transmittance, Crystals, Ions, Interfaces, Electron microscopy, Reflectivity, Carbonates

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Proceedings Article | 25 September 2008 Paper

Metal fluoride coatings prepared by ion-assisted deposition

Martin Bischoff, Maik Sode, Dieter Gäbler, Helmut Bernitzki, Christoph Zaczek, Norbert Kaiser, Andreas Tünnermann

Proceedings Volume 7101, 71010L (2008) https://doi.org/10.1117/12.797422

KEYWORDS: Metals, Thin films, Magnesium fluoride, Absorption, Refractive index, Ions, Fluorine, Photometry, Deposition processes, Surface roughness

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Proceedings Article | 5 October 2005 Paper

Properties of chirped mirrors manufactured by plasma ion assisted electron beam evaporation

Martin Bischoff, Olaf Stenzel, Dieter Gäbler, Norbert Kaiser

Proceedings Volume 5963, 59631N (2005) https://doi.org/10.1117/12.624603

KEYWORDS: Mirrors, Reflectivity, Plasma, Tolerancing, Electron beams, Refractive index, Ions, Ultrafast phenomena, Niobium, Error analysis

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