Martin Bischoff
at Fraunhofer-IOF
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 4 October 2011
Proc. SPIE. 8168, Advances in Optical Thin Films IV
KEYWORDS: Oxides, Thin films, Refractive index, Silica, Glasses, Ultraviolet radiation, Silicon, Coating, Semiconducting wafers, Temperature metrology

Proceedings Article | 22 April 2009
Proc. SPIE. 7131, XVII International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers
KEYWORDS: Reflectors, Mirrors, Contamination, Resonators, Crystals, Interfaces, Optical coatings, Laser resonators, Excimer lasers, Laser optics

Proceedings Article | 30 December 2008
Proc. SPIE. 7132, Laser-Induced Damage in Optical Materials: 2008
KEYWORDS: Reflectors, Crystals, Interfaces, Ions, Coating, Reflectivity, Carbonates, Electron microscopy, Transmittance, Excimer lasers

Proceedings Article | 25 September 2008
Proc. SPIE. 7101, Advances in Optical Thin Films III
KEYWORDS: Thin films, Refractive index, Magnesium fluoride, Metals, Ions, Surface roughness, Deposition processes, Photometry, Fluorine, Absorption

Proceedings Article | 5 October 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Ultrafast phenomena, Refractive index, Mirrors, Electron beams, Error analysis, Ions, Reflectivity, Niobium, Tolerancing, Plasma

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top